Intel's Test Quality System
نویسندگان
چکیده
his paper presents Intel's VLSI test quality system. The basis for this system is the integration of design and test. Tests can be generated at both a function-level of design and a logic-level. At either level the tests can be fault graded giving the designer feedback which can be used to alter the design or augment his test suite. The basic elements of the system are presented in this paper as well as a economic analysis of the system. This analysis is based on the experience with two specific VLSI products..
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تاریخ انتشار 2004